Next-Generation Defect Intelligence: Leveraging Xception Feature Embeddings with Deep Convolutional Inference for Surface Anomaly Detection. International Journal of AI Electronics and Nexus Energy, [S. l.], v. 2, n. 2, p. 589–602, 2026. DOI: 10.64751/ysfvbq86. Disponível em: https://zesterapublications.com/journals/index.php/ijaene/article/view/430. Acesso em: 25 sep. 2026.