A SCHOLARLY EXAMINATION OF THE CONSTANCY AND LEAKAGE MODERATION IN A FULLY SELECTED ELEVENTRANSISTOR STATIC RANDOM-ACCESS MEMORY CELL. IJAENE [Internet]. 2026 Feb. 28 [cited 2026 Jul. 30];2(1):18-24. Available from: https://zesterapublications.com/journals/index.php/ijaene/article/view/228